 | | Archived Webinar | Understanding Electrical Characterization of Solar Cells
Presenter: Dave Rose - Senior Staff Applications Engineer |  Recommend to your friends | The target objective of the majority of research into photovoltaic devices is in the areas of improving the conversion efficiency and lowering the cost of manufacturing. In order to verify that conversion efficiency has improved, a photovoltaic device must be electrically characterized. This seminar will discuss the different measurement techniques that can be used to characterize solar cells.
Those participating in this seminar will learn:
• How to measure short-circuit current (Isc), open circuit voltage (Voc), maximum power output (Pmax), and conversion efficiency
• How to select the correct instrumentation
• Key parameters of diodes, MOSFETs, and BJTs that determine end product efficiency
• Best practices to connect to the device |  |
| | Watch out for these new webinars | |
|  | | Archived webinars | Description: In recent years, there has been a surge of interest in the development of power semiconductor devices to meet the demands of more efficient, higher power end products. To improve efficiency, researchers have focused on refining certain key device parameters, and accurate testing of these parameters is needed to enable continuous improvement in device design. This seminar presents a broad overview of power devices and considers the motivation behind the swell in research concerning these devices, how the device parameters affect the efficiency of the end product, and what's being done to serve the needs of power device designers and test engineers. Those participating in this seminar will learn: How governmental standards and industrial compliance programs have spurred research in development of more efficient power semiconductors; Devices that make up the building blocks of power management modules; Key parameters of diodes, MOSFETs, and BJTs that determine end product efficiency; Solutions for testing the key power device parameters; The motivation for looking at advanced materials in the creation of power devices.
Target Audience: This seminar is recommended for students, device designers, test engineers, and test engineering managers who are facing the need to test power semiconductor discrete devices. | | Description: This seminar is designed to help laboratory engineers implement, troubleshoot, and verify pulsed I-V, transient I-V, and general Ultra-Fast I-V measurement systems. The seminar will provide the keys to getting good measurements. Topics to be discussed include system setup, typical measurement limitations, and results from some actual devices. By participating in this seminar, you will learn and understand: How to properly connect an Ultra-Fast I-V instrument to a probe station; Common problems encountered when not properly cabled; Tips on performance verification at the probe tips; Limitations in Ultra-Fast I-V including Johnson Noise and others; Typical examples of Ultra-Fast I-V on sample devices.
Target Audience: This seminar is intended for those whose job requires performing all types of characterization measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining characterization equipment and probe stations will also benefit from this seminar. | | Description: A source measurement unit (SMU) instrument can boost productivity, deliver more complete characterization, and increase overall test system performance. However, to truly optimize your testing, it's imperative to look beyond the "banner specs" when selecting the right SMU for your application. This web seminar will explain the basics of how SMU instruments work, describe key features and capabilities to consider for selecting an SMU instrument, and compare the actual performance of different SMU instruments in "real-world" applications. Target Audience: The material presented in this web seminar will be of value to engineers, researchers, educators, and students characterizing and testing semiconductor-based devices, components, materials, and technologies with current vs. voltage (I /V) characteristics that need to be verified and/or better understood. Typical devices and technologies include traditional silicon, compound semiconductor (for example, SiC, GaN) for power/energy applications like HBLEDs and solar cells, electronic components, nanotechnology, and emerging technologies such as graphene. | | Description: This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements. By participating in this seminar, you will learn and understand: How to estimate the speed and throughput impact of parallel WLR testing on traditional reliability structures; How to assess traditional test structures for use in a parallel test system; The source of measurement errors that impact WLR measurements; Typical configuration, measurement, and optimization techniques.
Target Audience: This seminar is recommended for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers. | | Description: The search to replace FG NAND and fast development of alternate non-volatile memory (NVM) technologies, such as Phase-Change memory (PCM/PRAM), Ferro-electric memory (FeRAM), Magnetoresistive memory (MRAM), and Resitive memory (ReRAM) is currently underway. Advanced characterization capabilities are critical for success of any new technology. Despite a significant variety in memory technologies, all of them share the need for the same type of characterization, such as transient switching behavior, endurance, and the need for dynamic current measurement. Non-Volatile Memory - Characterization and Measurement Techniques will discuss and provide examples on the common characterization and measurement techniques for various NVM technologies, including FLASH, PRAM, ReRAM, and FeRAM. This webinar will also provide an overview of improvements in standard instrumentation that provide pulse source and measurement with a single instrument that measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.
Target Audience: This seminar is recommended primarily for NVM test engineers, researchers, and test engineering managers, but it will be useful for any engineer or researcher/student in the NVM field. | | Description: Thyristors and Triacs are widely used by White Goods applications and in designs that required AC loads. This webinar will touch on the basics and family of Thryistors and Triacs and explain the leading advantage that NXP has in the Thyristor technologies. It will also enable you to understand what causes false triggering and highlight the benefits of using 3 Quadrant Triacs as well as the advantages of replacing mechanical relays with Triacs. |
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